The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Sep. 22, 2008
Tong Zhao, Fremont, CA (US);
Hui-chuan Wang, Pleasanton, CA (US);
Yu-chen Zhou, San Jose, CA (US);
Min LI, Dublin, CA (US);
Kunliang Zhang, Fremont, CA (US);
Tong Zhao, Fremont, CA (US);
Hui-Chuan Wang, Pleasanton, CA (US);
Yu-Chen Zhou, San Jose, CA (US);
Min Li, Dublin, CA (US);
Kunliang Zhang, Fremont, CA (US);
Headway Technologies, Inc., Milpitas, CA (US);
Abstract
A TMR sensor that includes a free layer having at least one B-containing (BC) layer made of CoFeB, CoFeBM, CoB, COBM, or CoBLM, and a plurality of non-B containing (NBC) layers made of CoFe, CoFeM, or CoFeLM is disclosed where L and M are one of Ni, Ta, Ti, W, Zr, Hf, Tb, or Nb. One embodiment is represented by (NBC/BC)where n≧2. A second embodiment is represented by (NBC/BC)/NBC where n≧1. In every embodiment, a NBC layer contacts the tunnel barrier and NBC layers each with a thickness from 2 to 8 Angstroms are formed in alternating fashion with one or more BC layers each 10 to 80 Angstroms thick. Total free layer thickness is <100 Angstroms. The free layer configuration described herein enables a significant noise reduction (SNR enhancement) while realizing a high TMR ratio, low magnetostriction, low RA, and low Hc values.