The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2015
Filed:
Nov. 03, 2011
Applicants:
Hitoshi Tokieda, Hitachinaka, JP;
Isao Yamazaki, Ryugasaki, JP;
Masaaki Hanawa, Hitachinaka, JP;
Inventors:
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/109 (2013.01); G01N 35/1065 (2013.01); Y10T 436/11 (2013.01); G01N 35/0099 (2013.01); G01N 2035/0443 (2013.01); G01N 2035/0444 (2013.01); G01N 2035/0455 (2013.01); G01N 2035/1093 (2013.01);
Abstract
An automatic analyzer having reagent disks disposed inside and outside a reaction disk. A plurality of reagent probes are alternately accessed one by one to each of the reagent disks per cycle. Each reagent probe comprises two arms rotatable independently of each other so that the reagent probe is able to access a plurality of points and interference between the plurality of reagent probes can be avoided. A first reagent and a second reagent can be loaded on each of the reagent disks.