The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Nov. 13, 2012
Applicant:
Sandisk Technologies Inc., Plano, TX (US);
Inventors:
Nima Mokhlesi, Los Gatos, CA (US);
Lanlan Gu, San Jose, CA (US);
Ashish Pal Singh Ghai, Santa Clara, CA (US);
Deepak Raghu, Milpitas, CA (US);
Assignee:
SANDISK TECHNOLOGIES INC., Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 29/04 (2006.01); G06F 11/10 (2006.01); G11C 11/56 (2006.01); G11C 16/34 (2006.01); G11C 29/02 (2006.01); G11C 29/50 (2006.01); G11C 29/52 (2006.01); G11C 16/00 (2006.01);
U.S. Cl.
CPC ...
G11C 16/04 (2013.01); G11C 29/04 (2013.01); G06F 11/1072 (2013.01); G11C 11/5642 (2013.01); G11C 16/00 (2013.01); G11C 16/3404 (2013.01); G11C 16/349 (2013.01); G11C 29/025 (2013.01); G11C 29/50016 (2013.01); G11C 29/52 (2013.01); G11C 2029/0409 (2013.01); G11C 2029/0411 (2013.01);
Abstract
Data, normally read using a page-by page read process, can be recovered from memory cells connected to a broken word line by performing a sequential read process. To determine whether a word line is broken, both a page-by page read process and a sequential read process are performed. The results of both read processes are compared. If the number of mismatches between the two read processes is greater than a threshold, it is concluded that there is a broken word line.