The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Aug. 09, 2012
Applicant:
Kozo Ariga, Tokyo, JP;
Inventor:
Kozo Ariga, Tokyo, JP;
Assignee:
Mitutoyo Corporation, Kanagawa, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/48 (2006.01); G01N 3/06 (2006.01); G01N 3/40 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 3/068 (2013.01); G01N 3/40 (2013.01); G06T 7/0002 (2013.01); G01N 2203/0647 (2013.01);
Abstract
A hardness tester includes a CCD camera, a monitor, a clipper (a CPU and a clipping program), and a display controller (the CPU and a display control program). The CCD camera captures an image of an indentation formed on a surface of a specimen via field lenses. The monitor displays the image of the indentation captured by the CCD camera. The clipper clips a plurality of regions from the image of the indentation captured by the CCD camera, the plurality of regions each containing a respective vertex. The display controller simultaneously displays on the monitor images of the plurality of regions clipped by the clipper.