The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Sep. 05, 2008
Applicants:

Efraim Rotem, Haifa, IL;

Eric Distefano, Livermore, CA (US);

Jim Hermerding, San Jose, CA (US);

Ronny Korner, Haifa, IL;

Yuval Yosef, Hadera, IL;

Inventors:

Efraim Rotem, Haifa, IL;

Eric Distefano, Livermore, CA (US);

Jim Hermerding, San Jose, CA (US);

Ronny Korner, Haifa, IL;

Yuval Yosef, Hadera, IL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/26 (2006.01); G06F 1/20 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 1/206 (2013.01); G06F 11/3006 (2013.01); G06F 11/3058 (2013.01); G06F 11/3089 (2013.01);
Abstract

Techniques to manage operational parameters for a processor are described. For instance, a method includes monitoring performance values representing physical characteristics for multiple components of a computing platform, and managing a performance level for a processor based on the performance values and one or more operational parameters for the processor. The operational parameters may include one or more transitory operational parameters that cause the processor to temporarily exceed operational parameters set by a thermal design power limit. Other embodiments are described and claimed.


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