The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Sep. 11, 2009
Applicants:

Mark E. Shannon, San Francisco, CA (US);

Mark F. Oldham, Los Gatos, CA (US);

David W. Ruff, San Francisco, CA (US);

Inventors:

Mark E. Shannon, San Francisco, CA (US);

Mark F. Oldham, Los Gatos, CA (US);

David W. Ruff, San Francisco, CA (US);

Assignee:

Applied Biosystems, LLC, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); C40B 30/04 (2006.01); G06F 19/20 (2011.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
C40B 30/04 (2013.01); C12Q 1/686 (2013.01); G06F 19/20 (2013.01);
Abstract

A method for determining bias across two domains comprising gene expression data. The method can comprise (a) providing a first domain and a second domain; (b) obtaining information indicative of a bias within the first domain; (c) obtaining information indicative of a bias within the second domain; and (d) using the information indicative of the bias within the first domain and the information indicative of the bias within the second domain to produce an indication of bias across the two domains.


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