The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Nov. 06, 2013
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

Kenneth P. Dobyns, Beaverton, OR (US);

Marcus K. DaSilva, Portland, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01); G01R 13/02 (2006.01); G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
H04B 17/00 (2013.01); G01R 13/0236 (2013.01); G01R 13/0272 (2013.01); G01R 23/16 (2013.01);
Abstract

A test and measurement instrument including a time domain channel configured to process a first input signal for analysis in a time domain; a frequency domain channel configured to process a second input signal for analysis in a frequency domain; and an acquisition system coupled to the time domain channel and the frequency domain channel. The acquisition system is configured to acquire data from the time domain channel and the frequency domain channel. Time domain and frequency domain data can be time aligned.


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Dobyns, Kenneth. (2015). Multi-domain test and measurement instrument (U.S. Patent No. 9020016). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9020016

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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