The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Nov. 12, 2012
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Ryuichi Hirano, Hachioji, JP;

Hideki Obuchi, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/24 (2006.01); G02B 21/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/08 (2013.01); G02B 21/24 (2013.01);
Abstract

A microscope system includes a microscope body having a base portion forming a foundation, an arm portion extending substantially parallel to a bottom surface of the base portion, and a frame portion connecting ends of the base portion and the arm portion, having substantially a C shape in side view and holding an illumination optical system ejecting illumination light from a light source to a specimen. A light source unit is connected with the microscope body and radiates illumination light to the illumination optical system. A focusing unit supports a stage for placing the specimen and at least holding an objective lens focusing the specimen by collecting observation light from the specimen on the stage. The microscope body and the focusing unit do not contact each other in a state where an optical axis of the objective lens coincides with an optical axis of the illumination light.


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