The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2015
Filed:
Oct. 05, 2011
Applicant:
Scott A. Chalmers, San Diego, CA (US);
Inventor:
Scott A. Chalmers, San Diego, CA (US);
Assignee:
Filmetrics, Inc., San Diego, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01B 11/06 (2006.01); G01N 21/55 (2014.01); G01N 21/59 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01B 11/0625 (2013.01); G01N 21/55 (2013.01); G01N 21/59 (2013.01); G01N 21/8422 (2013.01);
Abstract
Optical systems and methods are described that provide greater solving power for thin-film measurements in general, and provide a unique model-free solution for single-layer films in particular.
Chalmers, Scott. (2015). Combining normal-incidence reflectance and transmittance with non-normal-incidence reflectance for model-free characterization of single-layer films (U.S. Patent No. 9019484). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9019484
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile