The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2015

Filed:

Sep. 05, 2012
Applicant:

Georg Brenninger, Oberbergkirchen, DE;

Inventor:

Georg Brenninger, Oberbergkirchen, DE;

Assignee:

Siltronic AG, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); C23C 16/24 (2006.01); C30B 25/10 (2006.01); C23C 16/46 (2006.01); C23C 16/52 (2006.01); C30B 25/16 (2006.01); C30B 29/06 (2006.01); G01R 31/26 (2014.01); H01L 21/66 (2006.01); H01L 21/20 (2006.01); H01L 21/36 (2006.01); H01L 33/00 (2010.01); H01L 21/31 (2006.01); H01L 21/469 (2006.01);
U.S. Cl.
CPC ...
C23C 16/24 (2013.01); C30B 25/10 (2013.01); C23C 16/46 (2013.01); C23C 16/52 (2013.01); C30B 25/16 (2013.01); C30B 29/06 (2013.01);
Abstract

A layer is deposited onto a semiconductor wafer by CVD in a process chamber having upper and lower covers, wherein the wafer front side temperature is measured; the wafer is heated to deposition temperature; the temperature of the upper process chamber cover is controlled to a target temperature by measuring the temperature of the center of the outer surface of the upper cover as the value of a controlled variable of an upper cover temperature control loop; a gas flow rate of process gas for depositing the layer is set; and a layer is deposited on the heated wafer front side during control of the upper cover temperature to the target temperature. A process chamber suitable therefor has a sensor for measuring the upper cover outer surface center temperature and a controller for controlling this temperature to a predetermined value.


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