The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Jun. 19, 2013
Applicant:

Unitest Inc, Yongin-si, Gyeonggi-do, KR;

Inventors:

Eui Won Lee, Seongnam-si, KR;

Hyo Jin Oh, Yongin-si, KR;

Assignee:

Unitest Inc, Yongin-si, Gyeonggi-do, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 29/10 (2006.01); G06F 11/22 (2006.01); G06F 13/38 (2006.01); G06F 13/40 (2006.01); G11C 29/56 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G06F 11/2221 (2013.01); G06F 13/385 (2013.01); G06F 13/4022 (2013.01); G06F 2213/0026 (2013.01); G06F 2213/0028 (2013.01); G06F 2213/0032 (2013.01); G11C 29/56008 (2013.01); G11C 2029/0401 (2013.01);
Abstract

Disclosed is a solid state drive tester which divides the functions of generating and comparing test pattern data and Frame Information Structure (FIS) data with each other into each other to implement the functions as separate logics, so that entire test time is decreased by reducing load of a processor. The solid state drive tester includes a host terminal for receiving a test condition for testing a storage from a user, and a test control unit creating a test pattern corresponding to the test condition, and adaptively selecting an interface according to an interface type of the storage to be tested to test the storage using the test pattern, wherein the test control unit is divided into a control module for controlling the test of the storage and a test execution module for practically executing the test in hardware to test a plurality of storages in real time.


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