The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Jul. 18, 2013
Applicant:

Micron Technology Inc., Boise, ID (US);

Inventors:

Alan G Wood, Boise, ID (US);

David R Hembree, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/52 (2006.01); H01L 23/00 (2006.01); H01L 23/31 (2006.01); H01L 25/065 (2006.01); H01L 21/683 (2006.01); H01L 23/498 (2006.01);
U.S. Cl.
CPC ...
H01L 24/10 (2013.01); H01L 21/6835 (2013.01); H01L 23/3114 (2013.01); H01L 23/481 (2013.01); H01L 23/49827 (2013.01); H01L 24/45 (2013.01); H01L 24/48 (2013.01); H01L 24/78 (2013.01); H01L 24/85 (2013.01); H01L 25/0657 (2013.01); H01L 2221/6834 (2013.01); H01L 2224/1134 (2013.01); H01L 2224/45014 (2013.01); H01L 2224/45015 (2013.01); H01L 2224/45139 (2013.01); H01L 2224/4554 (2013.01); H01L 2224/45565 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/4813 (2013.01); H01L 2224/48145 (2013.01); H01L 2224/4824 (2013.01); H01L 2224/48471 (2013.01); H01L 2224/48475 (2013.01); H01L 2224/48599 (2013.01); H01L 2224/48699 (2013.01); H01L 2224/49429 (2013.01); H01L 2224/78301 (2013.01); H01L 2224/85001 (2013.01); H01L 2224/85045 (2013.01); H01L 2224/85051 (2013.01); H01L 2224/85121 (2013.01); H01L 2224/85205 (2013.01); H01L 2224/85951 (2013.01); H01L 2225/06506 (2013.01); H01L 2225/06513 (2013.01); H01L 2225/06524 (2013.01); H01L 2225/06541 (2013.01); H01L 2225/06596 (2013.01); H01L 2924/01012 (2013.01); H01L 2924/01013 (2013.01); H01L 2924/01014 (2013.01); H01L 2924/01027 (2013.01); H01L 2924/01028 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/01031 (2013.01); H01L 2924/01046 (2013.01); H01L 2924/01047 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01074 (2013.01); H01L 2924/01078 (2013.01); H01L 2924/01079 (2013.01); H01L 2924/01082 (2013.01); H01L 2924/014 (2013.01); H01L 2924/14 (2013.01); H01L 2924/1433 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/19042 (2013.01); H01L 2924/20751 (2013.01); H01L 2924/20752 (2013.01); H01L 2924/20753 (2013.01); H01L 2924/20754 (2013.01); H01L 2924/20755 (2013.01); H01L 2924/20756 (2013.01); H01L 2924/20757 (2013.01); H01L 2924/20758 (2013.01); H01L 2924/20759 (2013.01); H01L 2924/2076 (2013.01); H01L 2924/30105 (2013.01); H01L 2924/30107 (2013.01); H01L 2924/3011 (2013.01); H01L 2924/3025 (2013.01); H01L 24/49 (2013.01); H01L 2924/0102 (2013.01); H01L 2924/01033 (2013.01); H01L 2924/01043 (2013.01); H01L 2924/00015 (2013.01); H01L 2224/45124 (2013.01); H01L 2224/48992 (2013.01); H01L 2224/02335 (2013.01); H01L 2224/02333 (2013.01); H01L 2224/02372 (2013.01); H01L 2224/13024 (2013.01); H01L 24/11 (2013.01); H01L 24/13 (2013.01);
Abstract

A through wire interconnect for a semiconductor substrate includes a via extending through the semiconductor substrate from the first side to the second side thereof; a wire in the via having a first end with a bonded connection to the substrate contact and a second end proximate to the second side of the semiconductor substrate; a dielectric material in the via configured to electrically insulate the wire from the semiconductor substrate; a bonding member bonded to the first end of the wire and to the substrate contact configured to secure the wire to the substrate contact; and a contact on the second end of the wire.


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