The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Sep. 19, 2013
Applicant:

Industrial Technology Research Institute, Hsin-Chu, TW;

Inventors:

Yi-Wei Lin, Yunlin County, TW;

Yu-Tai Li, Taichung, TW;

Hung-Sen Wu, Taoyuan, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01); G01J 3/28 (2006.01); G01J 3/44 (2006.01); G01J 3/10 (2006.01); G01J 3/02 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01J 3/28 (2013.01); G01J 3/4406 (2013.01); G01J 3/10 (2013.01); G01J 3/0208 (2013.01); G01N 21/64 (2013.01);
Abstract

A material aging test apparatus and method thereof are provided. The aging apparatus includes a pulsed laser, a beam expansion assembly, a platform, and a spectrum analyzer. The pulsed laser is used for transmitting a first beam. The beam expansion assembly is used for converting the first beam into a second beam and projecting the second beam onto an object. The platform is used for carrying the object. The spectrum analyzer is used for measuring the spectral response which is generated from the object by the projection of the second beam.


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