The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2015

Filed:

Apr. 07, 2014
Applicant:

Hoya Corporation, Tokyo, JP;

Inventors:

Kouji Kitsunai, Tokyo, JP;

Hiroshi Takeda, Tokyo, JP;

Yukari Senda, Tokyo, JP;

Assignee:

Hoya Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/73 (2006.01); C03C 3/083 (2006.01); G11B 5/82 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G11B 5/7315 (2013.01); G11B 5/82 (2013.01); G11B 20/1816 (2013.01); G11B 2220/2516 (2013.01); C03C 3/083 (2013.01);
Abstract

The shape and number of surface defects are controlled so that the occurrence of failure is suppressed in an HDD device in which a magnetic head with a very small flying height, such as a DFH head, is mounted. A magnetic disk substrate is characterized in that when laser light with a wavelength of 405 nm and a laser power of 25 mW is irradiated with a spot size of 5 μm and scattered light from the substrate is detected, the number of defects detected to have a size of 0.1 μm to not more than 0.3 μm is less than 50 per 24 cmand, with respect to the defects, there is no defect in which, in a bearing curve obtained by a bearing curve plot method using an atomic force microscope, a portion from an apex of the defect to 45% thereof is located in an area of defect height higher than a virtual line connecting from the apex of the defect to 45% thereof.


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