The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2015
Filed:
May. 07, 2012
Franck Laffargue, Toulouse, FR;
Patrice Thebault, Lapeyrouse-Fossat, FR;
Jeffrey Mark Hunt, Kirkland, WA (US);
Franck Laffargue, Toulouse, FR;
Patrice Thebault, Lapeyrouse-Fossat, FR;
Jeffrey Mark Hunt, Kirkland, WA (US);
INTERMEC IP Corp., Everett, WA (US);
Abstract
Systems and methods of determining the volume and dimensions of a three-dimensional object using a dimensioning system are provided. The dimensioning system can include an image sensor, a non-transitory, machine-readable, storage, and a processor. The dimensioning system can select and fit a three-dimensional packaging wireframe model about each three-dimensional object located within a first point of view of the image sensor. Calibration is performed to calibrate between image sensors of the dimensioning system and those of the imaging system. Calibration may occur pre-run time, in a calibration mode or period. Calibration may occur during a routine. Calibration may be automatically triggered on detection of a coupling between the dimensioning and the imaging systems.