The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2015

Filed:

Aug. 28, 2008
Applicants:

Bryan Edward Cole, Cambridge, GB;

Vincent Patrick Wallace, Cambridge, GB;

Michael John Withers, Cambridge, GB;

John Baker, Cambridge, GB;

Brian Robertson, Cambridge, GB;

Inventors:

Bryan Edward Cole, Cambridge, GB;

Vincent Patrick Wallace, Cambridge, GB;

Michael John Withers, Cambridge, GB;

John Baker, Cambridge, GB;

Brian Robertson, Cambridge, GB;

Assignee:

TeraView Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); A61B 5/00 (2006.01); G01N 21/3581 (2014.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0086 (2013.01); A61B 5/0062 (2013.01); G01N 21/3581 (2013.01); A61B 1/00096 (2013.01); A61B 1/00172 (2013.01); A61B 5/7257 (2013.01);
Abstract

A THz radiation probe () for examining an object (), the probe comprising a first portion configured to be inserted into an opening of said object in a first direction (), said probe further comprising at least one THz emitter (), directing means () for directing THz radiation emitted from said emitter to said object via an aperture () located at said first portion and subsequently from said object to at least one THz detector () and, means for scanning said emitted THz radiation across said object in a scan direction, said scan direction having a component in said first direction ().


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