The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Jun. 19, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Masato Muraki, Inagi, JP;

Satoru Oishi, Utsunomiya, JP;

Hiromi Kinebuchi, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/08 (2006.01); G11B 23/38 (2006.01); H01L 23/00 (2006.01); G03F 7/20 (2006.01); H01L 21/00 (2006.01); H01J 37/00 (2006.01);
U.S. Cl.
CPC ...
G11B 23/38 (2013.01); G03F 7/2057 (2013.01); H01L 24/00 (2013.01);
Abstract

A drawing apparatus performs drawing on a first partial region and a second partial region. The first and second partial regions having an overlap region in which the first and second partial regions overlap each other. The apparatus includes a transformation device configured to transform first pattern data for the first partial region into first quantized pattern data in accordance with a first transformation rule, and to transform second pattern data for the second partial region into second quantized pattern data in accordance with a second transformation rule different from the first transformation rule, and a controller configured to control the drawing on the first partial region based on the first quantized pattern data, and to control the drawing on the second partial region based on the second quantized pattern data.


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