The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2015

Filed:

Sep. 03, 2013
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Adam Brand, Palo Alto, CA (US);

Bingxi Wood, Cupertino, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/3205 (2006.01); H01L 29/76 (2006.01); H01L 29/49 (2006.01);
U.S. Cl.
CPC ...
H01L 29/49 (2013.01);
Abstract

The control of gate widths is improved for system-on-a-chip (SoC) devices which require multiple gate dielectric 'gate' thicknesses, e.g., for analog and digital processing on the same chip. A hard mask is formed to protect a thick gate while the thin gate region is etched to remove oxide (sometimes referred to as a preclean step). The patterned substrate is then processed to selectively deposit a second thickness of gate material. The thin gate may be silicon oxide and the physical thickness of the thin gate may be less than that of the thick gate. In a preferred embodiment, the substrate is not exposed to air or atmosphere after the hardmask is removed.


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