The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2015
Filed:
Dec. 28, 2006
Applicants:
Gordon Holt, Beaverton, OR (US);
Hernan Castro, Shingle Springs, CA (US);
Brandon Barnett, Beaverton, OR (US);
Inventors:
Gordon Holt, Beaverton, OR (US);
Hernan Castro, Shingle Springs, CA (US);
Brandon Barnett, Beaverton, OR (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/32 (2006.01); G01N 27/327 (2006.01); G01N 27/00 (2006.01); G01N 27/22 (2006.01);
U.S. Cl.
CPC ...
G01N 27/3276 (2013.01); G01N 27/22 (2013.01);
Abstract
Described are devices and methods for detecting the match quality and concentration of analytes binding to an electrode surface. The devices utilize a clock to measure capacitance change as a function of time and a temperature controller to measure the capacitance change as a function of temperature.