The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2015

Filed:

May. 09, 2011
Applicant:

Kenneth C. Johnson, Santa Clara, CA (US);

Inventor:

Kenneth C. Johnson, Santa Clara, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G02B 27/42 (2006.01);
U.S. Cl.
CPC ...
G03F 7/7015 (2013.01); G02B 27/4222 (2013.01);
Abstract

Optical radiation patterns at two wavelengths, an 'imaging' wavelength and a 'masking' wavelength, are superimposed on a photochromic layer, wherein the masking wavelength induces optical absorbance in the layer, allowing the imaging wavelength to transmit only through narrow transmittance zones where the masking-wavelength radiation has an optical null. The patterns are preferably formed as a focal-point array. At each focal point a focused-radiation spot at the imaging wavelength is superimposed with an annular-radiation spot at the masking wavelength. The spots may be generated by an array of microlenses with focal points proximate the layer. (Several novel types of dual-wavelength microlenses are disclosed.) Alternatively, the focused-radiation spots may be generated in separate optical paths for the two wavelengths, and optically combined at the photochromic layer by means of beam-combining and projection optics. The radiation patterns can also comprise full-field images, which are formed by separate photomasks for the two wavelengths.


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