The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Oct. 19, 2012
Carl Zeiss Microscopy Gmbh, Jena, DE;
Manfred Matthae, Jena, DE;
Georg Herbst, Goettingen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention relates to a planapochromatically-corrected immersion microscope objective for high-resolution microscopy applications with changing dispersive immersion conditions, having a plurality of lenses and/or subsystems (T, T, T) comprising lens groups and a corrective function (LA) for eliminating spherical aberrations. According to the invention, the microscope objective has an additional corrective function (LA) for eliminating longitudinal chromatic aberrations caused by dispersive changes in the immersion by changing the air gaps between the lenses or gap combinations, wherein the influence on the longitudinal chromatic aberration corresponds to a rotation of the curve s(λ), which describes the color point (s) as a function of the wavelength (λ).