The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Aug. 21, 2012
Masaaki Kurokawa, Tokyo, JP;
Jun Yasui, Tokyo, JP;
Keiichi Kenmotsu, Tokyo, JP;
Shigetoshi Shiotani, Tokyo, JP;
Masaaki Kurokawa, Tokyo, JP;
Jun Yasui, Tokyo, JP;
Keiichi Kenmotsu, Tokyo, JP;
Shigetoshi Shiotani, Tokyo, JP;
Mitsubishi Hitachi Power Systems, Ltd., Yokohama-Shi, JP;
Abstract
A film thickness measurement apparatus includes: an ECT sensor for measuring a film thickness of a thermal barrier coating formed on a turbine blade; a storage unit for storing a measurement point on the turbine blade which is a point where the film thickness of the thermal barrier coating is measured; a laser displacement meter for measuring a shape of the turbine blade; a measurement position calculation unit for calculating an actual measurement point suitable for actual film thickness measurement using the ECT sensor, based on the shape of the turbine blade measured by the laser displacement meter and the measurement point on the turbine blade stored in the storage unit; and an arm drive unit for driving the ECT sensor to adjust a measurement position of the ECT sensor based on the actual measurement point calculated by the measurement position calculation unit.