The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Apr. 28, 2011
Applicants:

Stephen Purcell, Mountain View, CA (US);

Christopher Philip Alan Tann, San Jose, CA (US);

Jason Rupert Redgrave, Mountain View, CA (US);

Cüneyt Özdaş, Berkeley, CA (US);

Inventors:

Stephen Purcell, Mountain View, CA (US);

Christopher Philip Alan Tann, San Jose, CA (US);

Jason Rupert Redgrave, Mountain View, CA (US);

Cüneyt Özdaş, Berkeley, CA (US);

Assignee:

Imagination Technologies, Limited, Kings Langley, Hertfordshire, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01);
U.S. Cl.
CPC ...
Abstract

Aspects include systems, methods, and media for implementing methods relating to increasing consistency of results during intersection testing. In an example, vertexes define edges of primitives composing a scene (e.g., triangles defining a mesh for a surface of an object in a 3-D scene). An edge can be shared between two primitives. Intersection testing algorithms can use tests involving edges to determine whether or not the ray intersects a primitive defined by those edges. In one approach, a precedence among the vertexes defining a particular edge is enforced for such intersection testing. The precedence causes an intersection tester to always test a given edge in the same orientation, regardless of which primitive defined (at least in part) by that edge is being intersection tested.


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