The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Mar. 10, 2014
Applicant:

Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Gmbh, Heimstetten, DE;

Inventor:

Pavel Adamec, Haar, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/073 (2006.01); H01J 37/317 (2006.01); H01J 37/26 (2006.01); H01J 1/304 (2006.01); H01J 37/063 (2006.01);
U.S. Cl.
CPC ...
H01J 37/073 (2013.01); H01J 37/26 (2013.01); H01J 37/3174 (2013.01); H01J 2237/063 (2013.01); H01J 2237/06325 (2013.01); H01J 1/304 (2013.01); H01J 37/063 (2013.01);
Abstract

A charged particle beam source device adapted for generating a charged particle beam is provided. The charged particle beam source device includes an emitter tip adapted for providing charged particles. Furthermore, an extractor electrode having an aperture opening is provided for extracting the charged particles from the emitter tip. An aperture angle of the charged particle beam is 2 degrees or below the aperture angle being defined by a width of the aperture opening and a distance between the emitter tip and the extractor electrode, wherein the distance between the emitter tip and the extractor electrode is a range from 0.1 mm to 2 mm.


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