The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Sep. 26, 2013
Applicant:
Picarro, Inc., Santa Clara, CA (US);
Inventors:
John A. Hoffnagle, San Jose, CA (US);
Sze Meng Tan, Sunnyvale, CA (US);
Chris W. Rella, Sunnyvale, CA (US);
Assignee:
Picarro, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/61 (2006.01); G01N 21/25 (2006.01); G01J 3/28 (2006.01); G01N 21/39 (2006.01); H01S 3/139 (2006.01); G01J 3/42 (2006.01);
U.S. Cl.
CPC ...
G01N 21/255 (2013.01); G01J 3/28 (2013.01); G01N 21/39 (2013.01); H01S 3/1392 (2013.01); G01J 3/42 (2013.01);
Abstract
For cavity enhanced optical spectroscopy, the cavity modes are used as a frequency reference. Data analysis methods are employed that assume the data points are at equally spaced frequencies. Parameters of interest such as line width, integrated absorption etc. can be determined from such data without knowledge of the frequencies of any of the data points.