The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Aug. 20, 2013
Otsuka Electronics Co., Ltd., Hirakata-shi, JP;
Yoshi Enami, Ritto, JP;
Otsuka Electronics Co., Ltd., Hirakata-Shi, JP;
Abstract
A light distribution characteristic measurement apparatus includes: a detecting unit for detecting light from a light source; a mirror for reflecting the light from the light source to direct the light to the detecting unit; a movement mechanism for moving the detecting unit and the mirror relatively to the light source; a rotation mechanism for rotating the mirror while maintaining an optical path length from the light source to the detecting unit; and a processor adapted to calculate the light distribution characteristic of the light source, based on a plurality of measurement results that are detected by the detecting unit under a condition that the detecting unit and the mirror are arranged at a plurality of measurement positions relative to the light source and the mirror is oriented at different rotational angles for each measurement position.