The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Apr. 13, 2012
Applicant:

Hiromi Oshima, Gunma, JP;

Inventor:

Hiromi Oshima, Gunma, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G11C 29/56 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G11C 29/56012 (2013.01); G01R 31/31726 (2013.01);
Abstract

A test apparatus that tests a device under test outputting a data signal and a clock signal indicating a timing at which the data signal is to be sampled, the test apparatus comprising a data acquiring section that acquires the data signal output by the device under test, at a timing corresponding to a sampling clock corresponding to the clock signal output by the device under test or a timing of a timing signal corresponding to a test period of the test apparatus; a judging section that judges pass/fail of the device under test, based on a result of a comparison between the data signal acquired by the data acquiring section and an expected value; and a designating section that designates whether the data acquiring section acquires the data signal at the timing corresponding to the sampling clock or at the timing corresponding to the timing signal.


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Oshima, Hiromi. (2015). Test apparatus and test method (U.S. Patent No. 8981786). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8981786

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