The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Jun. 22, 2012
Applicants:
Yoshikazu Abe, Miyagi, JP;
Hisao Hori, Miyagi, JP;
Yoshihiro Sato, Miyagi, JP;
Inventors:
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02N 2/00 (2006.01); H01H 57/00 (2006.01); H01L 41/04 (2006.01);
U.S. Cl.
CPC ...
H02N 2/0075 (2013.01); H01H 57/00 (2013.01); H01L 41/042 (2013.01); H01H 2057/006 (2013.01);
Abstract
Provided is an actuator apparatus including: an actuator that is provided with a driving voltage at one end and a reference potential at the other end to enable driving; a first setting section that is connected to the one end of the actuator and sets an operating speed of the actuator; a second setting section that is provided between the one end of the actuator and the reference potential, and sets the driving voltage of the actuator.
Abe, Yoshikazu. (2015). Actuator apparatus, test apparatus, and test method (U.S. Patent No. 8981617). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8981617
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile