The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Mar. 27, 2014
Applicant:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Inventors:

Paul Ouyang, Shanghai, CN;

Wenjun Weng, Shanghai, CN;

Huijuan Cheng, Shanghai, CN;

Jie Chen, Shanghai, CN;

Hongwei Li, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/62 (2006.01); H01L 27/02 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0277 (2013.01);
Abstract

An electrostatic discharge (ESD) protection structure and an ESD protection circuit are provided. A PMOS transistor is located in a first region of a first N-type well region of a semiconductor substrate. A first doped base region located in a second region of a first N-type well region is N-type doped and connected to an external trigger-voltage adjustment circuit. An NMOS transistor is located in a third region of a first P-type well region. Second doped base regions discretely located in a fourth region of a first P-type well region are P-type doped and connected to the external trigger-voltage adjustment circuit. A first N-region is located in the fourth region, surrounding the second doped base regions, and connected to the I/O interface terminal. A second N-region is located in the fourth region, surrounding the first N-region and the second doped base regions, and connected to the ground terminal.


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