The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Feb. 24, 2006
Applicants:

Yuji Kikuchi, Tokyo, JP;

Hiroko Kikuchi, Sapporo, JP;

Taiji Nishi, Tokyo, JP;

Takenori Kitani, Tsukuba, JP;

Yukihiro Yanagawa, Kamisu, JP;

Motohiro Fukuda, Tsukuba, JP;

Inventors:

Yuji Kikuchi, Tokyo, JP;

Hiroko Kikuchi, Sapporo, JP;

Taiji Nishi, Tokyo, JP;

Takenori Kitani, Tsukuba, JP;

Yukihiro Yanagawa, Kamisu, JP;

Motohiro Fukuda, Tsukuba, JP;

Assignees:

National Food Research Institute, Tsukuba-shi, JP;

Kuraray Co., Ltd., Kurashiki-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/22 (2006.01); C12M 3/00 (2006.01); C12M 1/12 (2006.01); C12M 1/00 (2006.01); C12M 3/06 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
C12M 23/16 (2013.01); B01L 3/5027 (2013.01);
Abstract

A cell culture plate has a plurality of flow channels, uneven pattern areas and through holes. The flow channels are formed between the uneven pattern areas, and culture solution flows from the flow channels into the uneven pattern areas or from the uneven pattern areas into the flow channels. The uneven pattern area has uneven patterns that create a cell culture space.


Find Patent Forward Citations

Loading…