The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 10, 2015
Filed:
Jun. 13, 2012
Michele Dalla-torre, Givataim, IL;
Gil Shabat, Raanana, IL;
Adi Dafni, Kibbutz Givat Brener, IL;
Amit Batikoff, Petach Tikva, IL;
Michele Dalla-Torre, Givataim, IL;
Gil Shabat, Raanana, IL;
Adi Dafni, Kibbutz Givat Brener, IL;
Amit Batikoff, Petach Tikva, IL;
Applied Materials Israel, Ltd., Rehovot, IL;
Abstract
An analysis system for detection of defects within an inspection image of an inspected object, the inspection image comprising a plurality of pixels, the system including: a computerized segmentation module configured to segmentize the inspection image based on multiple anchor locations and on a mask which defines multiple mask-segments, by assigning each part out of multiple parts of the inspection image to a respective image-segment selected out of a multiple image segments, wherein the multiple image segments correspond to at least one mask-segment of said multiple mask-segments; and a defect detection processor configured to determine a presence of a defect in the inspection image based on the segmentation at least by assessing each pixel out of a plurality of pixels of the inspection image.