The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Feb. 24, 2012
Applicants:
David Shim, Seattle, WA (US);
Brad Bicknell, Seattle, WA (US);
George Varghese, Kirkland, WA (US);
Nick Gerner, Seattle, WA (US);
Weilie Yi, Bellevue, WA (US);
Inventors:
David Shim, Seattle, WA (US);
Brad Bicknell, Seattle, WA (US);
George Varghese, Kirkland, WA (US);
Nick Gerner, Seattle, WA (US);
Weilie Yi, Bellevue, WA (US);
Assignee:
Placed, Inc., Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A data collection system that provides the means to collect, store and make data available for a location analytics inference pipeline. The system incorporates a feedback mechanism enabling algorithms produced from the inference pipeline to drive the collection strategy to yield higher data quality and to produce reference data for model validation.
Published as: