The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Sep. 15, 2011
Atsushi Suzuki, Naka, JP;
Koji Kamoshida, Hitachinaka, JP;
Masashi Akutsu, Hitachinaka, JP;
Kenichi Takahashi, Naka, JP;
Hiroshi Ohga, Hitachiomiya, JP;
Atsushi Suzuki, Naka, JP;
Koji Kamoshida, Hitachinaka, JP;
Masashi Akutsu, Hitachinaka, JP;
Kenichi Takahashi, Naka, JP;
Hiroshi Ohga, Hitachiomiya, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A method for controlling an automated sample test system includes a samples conveyance line for conveying samples racks, each holding samples, to a plurality of processing units, and an empty-rack stock section in which to stock samples racks not holding a sample. The control method is designed to collect information on whether the processing units are in need of a supply of empty samples racks, and then supply empty samples racks from the empty-rack stock section to the processing units based on the information. Decreases in throughput can be prevented by leveling the number of empty samples racks supplied to the processing units that require empty samples racks.