The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Mar. 12, 2013
Applicant:

Rigaku Corporation, Tokyo, JP;

Inventors:

Katsunari Sasaki, Tokyo, JP;

Yukihiro Hara, Tokyo, JP;

Kiyoshi Akiyama, Tokyo, JP;

Assignee:

Rigaku Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G01N 23/04 (2006.01); G01N 23/20 (2006.01); G01N 23/207 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 23/223 (2013.01); G01N 23/207 (2013.01);
Abstract

There is provided an X-ray composite apparatus capable of performing, with one unit, X-ray CT and element analysis by fluorescent X-rays. The X-ray composite apparatusincludes an X-ray sourcegenerating cone beam X-rays, a sample supportholding a sample S, collimator partsandcapable of narrowing the cone beam X-rays to form parallel X-rays, depending on the intended use, between the X-ray source and the sample support, a two-dimensional detectordetecting the cone beam X-rays transmitted through the sample S, and a fluorescent X-ray detectordetecting fluorescent X-rays radiated from the sample S, and when the apparatus is used for X-ray CT, the apparatus irradiates the sample with the cone beam X-rays, while when the apparatus is used for fluorescent X-ray analysis, the apparatus irradiates the sample S with the parallel X-rays.


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