The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Sep. 13, 2012
Applicants:

Jiro Yokoya, Kawasaki, JP;

Tsuyoshi Nakamura, Kawasaki, JP;

Hiroaki Shimizu, Kawasaki, JP;

Hideto Nito, Kawasaki, JP;

Inventors:

Jiro Yokoya, Kawasaki, JP;

Tsuyoshi Nakamura, Kawasaki, JP;

Hiroaki Shimizu, Kawasaki, JP;

Hideto Nito, Kawasaki, JP;

Assignee:

Tokyo Ohka Kogyo Co., Ltd., Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/26 (2006.01); G03F 7/20 (2006.01); G03F 7/004 (2006.01); G03F 7/38 (2006.01); G03F 7/039 (2006.01);
U.S. Cl.
CPC ...
G03F 7/20 (2013.01); G03F 7/004 (2013.01); G03F 7/0045 (2013.01); G03F 7/38 (2013.01); G03F 7/0397 (2013.01);
Abstract

A method of forming a resist pattern, including: step (1) in which a resist composition including a base component, a photobase generator component and an acid supply component is applied to a substrate to form a resist film; step (2) in which the resist film is subjected to exposure without being subjected to prebaking; step (3) in which baking is conducted after step (2), such that, at an exposed portion of the resist film, the base generated from the photobase generator component upon the exposure and an acid derived from the acid supply component are neutralized, and at an unexposed portion of the resist film, the solubility of the base component in an alkali developing solution is increased by the action of the acid derived from the acid supply component; and step (4) in which the resist film is subjected to an alkali development, thereby forming a negative-tone resist pattern.


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