The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Jul. 30, 2013
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Mahesh A. Iyer, Fremont, CA (US);

Amir H. Mottaez, Los Altos, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5072 (2013.01);
Abstract

Systems and techniques are described for performing numerical delay, area, and leakage power optimization on a circuit design. During operation, an embodiment can iteratively perform at least the following set of operations in a loop, wherein in each iteration a current threshold voltage value is progressively decreased: (a) perform numerical delay optimization on the circuit design using a numerical delay model that is generated using gates in a technology library whose threshold voltages are equal to the current threshold voltage; (b) perform a total negative slack based buffering optimization on the circuit design; and (c) perform a worst negative slack touchup optimization on the circuit design that uses gates whose threshold voltages are greater than or equal to the current threshold voltage. Next, the embodiment can perform combined area and leakage power optimization on the circuit design. The embodiment can then perform multiple iterations of worst negative slack touchup optimization.


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