The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

May. 01, 2012
Applicant:

Robert Todd Wilkinson, Plano, TX (US);

Inventor:

Robert Todd Wilkinson, Plano, TX (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04J 1/16 (2006.01); G06F 11/00 (2006.01); H04J 3/14 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); H04L 41/5009 (2013.01); H04L 43/08 (2013.01);
Abstract

Systems and methods for data integrity scoring and visualization for network and customer experience monitoring are described. In some embodiments, a method may include receiving a first set of vectors, each vector representing a network event generated by a network testing system, each vector including a plurality of dimensions and a first plurality of values, each value associated with a corresponding one of the dimensions. The method may also include identifying a second set of vectors representing at least a portion of the network events as observed by a network monitoring system, each vector in the second set of vectors including the plurality of dimensions and a second plurality of values. The method may further include calculating a presence score as a ratio between a number of vectors in the second and first sets of vectors, and/or an accuracy score as a measure of a discrepancy between corresponding values.


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