The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Apr. 15, 2011
Applicant:

Kevin M. Ferguson, Beaverton, OR (US);

Inventor:

Kevin M. Ferguson, Beaverton, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01); G06T 7/00 (2006.01); H04N 13/04 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0018 (2013.01); H04N 13/0425 (2013.01); G06T 7/0002 (2013.01); H04N 2013/0088 (2013.01); H04N 2013/0081 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30168 (2013.01); G06T 2207/10021 (2013.01);
Abstract

A method of generating a predictive picture quality rating makes a disparity measurement of a three-dimensional image by comparing left and right sub-components of the three-dimensional image. Then the left and right sub-components of the three-dimensional image are combined (fused) into a two-dimensional image, using data from the disparity measurement for the combination. A predictive quality measurement is then generated based on the two-dimensional image, and further including quality information about the comparison of the original three-dimensional image.


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