The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Aug. 27, 2013
Applicant:

Sumitomo Electric Industries, Ltd., Osaka, JP;

Inventors:

Shinsuke Fujiwara, Itami, JP;

Hiroaki Yoshida, Itami, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 33/00 (2010.01); H01L 29/32 (2006.01); C30B 19/02 (2006.01); C30B 23/02 (2006.01); C30B 25/02 (2006.01); C30B 29/40 (2006.01); H01L 21/02 (2006.01); H01L 33/02 (2010.01);
U.S. Cl.
CPC ...
H01L 29/32 (2013.01); C30B 19/02 (2013.01); C30B 23/02 (2013.01); C30B 25/02 (2013.01); C30B 29/406 (2013.01); H01L 21/02389 (2013.01); H01L 21/0243 (2013.01); H01L 21/02458 (2013.01); H01L 21/0254 (2013.01); H01L 21/0262 (2013.01); H01L 21/02625 (2013.01); H01L 21/02658 (2013.01); H01L 33/025 (2013.01); H01L 33/0075 (2013.01);
Abstract

Toward making available III nitride crystal substrates advantageously employed in light-emitting devices, and light-emitting devices incorporating the substrates, a III nitride crystal substrate has a major face whose surface area is not less than 10 cmand is characterized by: edge dislocations in the crystal being concentrated along propagation lines forming an angle of some 0° to 5° with a given {0001} plane of the crystal; screw dislocations in the crystal being concentrated along propagation lines forming an angle of some 45° to 60° with the given {0001} plane; and in a major-face principal region excluding the peripheral margin of the major face from its outer periphery to a 5 mm separation from its outer periphery, the total dislocation density being between 1×10cmto 3×10cminclusive, and the ratio of screw-dislocation density to the total dislocation density being 0.5 or greater.


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