The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
May. 21, 2013
Avaya, Inc., Basking Ridge, NJ (US);
Dan Gluskin, Tel-Aviv, IL;
Michael German, Modiin, IL;
Itai Ephraim Zilbershtein, Hod-Hasharon, IL;
Yosef Goldberg, Nechusha, IL;
Michel Ivgi, Yehud, IL;
Avaya Inc., Basking Ridge, NJ (US);
Abstract
Disclosed is a method and tool that performs glass-to-glass testing of a test AV system. The test AV system may be a transmitter device that senses AV stimuli and transmits an AV signal to a receiver device that displays video and provides an audio out/speaker of the audio. A light source and a sound source may be placed at the transmitter device. A light sensor and microphone/direct audio out connection may be placed at the receiver device. The automatic test tool may cycle synchronized light/sound stimuli to the transmitter device and measure the delay/latency times for audio, video, and AV synchronization at the receiver device. The automatic test tool may be comprised of a computer running user interface/test management software connected to a low cost FPGA that controls the video/sound sources and sensors to accurately measure both video and audio glass-to-glass latency/synchronization in a continuous, automatic, and self-calibrating manner.