The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Sep. 28, 2011
Applicants:

Pascale Senellart, Orsay, FR;

Aristide Lemaitre, Etampes, FR;

Steffen Michaelis DE Vasconcellos, Detmold, DE;

Olivier Gazzano, Paris, FR;

Joel Bellessa, Lyons, FR;

Olivier Daniel, Champs sur Marne, FR;

Inventors:

Pascale Senellart, Orsay, FR;

Aristide Lemaitre, Etampes, FR;

Steffen Michaelis De Vasconcellos, Detmold, DE;

Olivier Gazzano, Paris, FR;

Joel Bellessa, Lyons, FR;

Olivier Daniel, Champs sur Marne, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 33/00 (2010.01); H01L 33/58 (2010.01); B82Y 20/00 (2011.01); H01L 31/0232 (2014.01); H01L 31/0352 (2006.01); H01L 33/10 (2010.01); H01L 33/46 (2010.01); H01L 33/04 (2010.01);
U.S. Cl.
CPC ...
H01L 33/58 (2013.01); B82Y 20/00 (2013.01); H01L 31/02325 (2013.01); H01L 31/02327 (2013.01); H01L 31/035209 (2013.01); H01L 31/035236 (2013.01); H01L 33/105 (2013.01); H01L 33/465 (2013.01); H01L 33/04 (2013.01);
Abstract

A light source or sensor including: a stack of dielectric or semiconductive layers includes an alternation in a vertical direction of layers of high refractive index and of low refractive index forming an interference mirror, and presenting a top layer of high refractive index; at least one first metal pellet deposited or transferred on the top layer of the stack of layers to form a structure supporting a first Tamm plasmon mode that is spatially localized in at least one lateral direction perpendicular to the vertical direction; and at least one light emitter or detector arranged inside the stack of layers under the metal pellet and at a depth corresponding to a local maximum of the electric field of the Tamm plasmon mode to emit or detect radiation at the resonant wavelength thereof.


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