The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Feb. 12, 2014
Applicant:

Ict Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Gmbh, Heimstetten, DE;

Inventor:

Pavel Adamec, Haar, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/073 (2006.01); H01J 37/02 (2006.01); H01J 37/063 (2006.01); H01J 37/24 (2006.01);
U.S. Cl.
CPC ...
H01J 37/026 (2013.01); H01J 37/073 (2013.01); H01J 37/063 (2013.01); H01J 37/243 (2013.01);
Abstract

A gun arrangement configured for generating a primary electron beam for a wafer imaging system is described. The arrangement includes a controller configured for switching between a normal operation and a cleaning operation, a field emitter having an emitter tip adapted for providing electrons and emitting an electron beam along an optical axis, an extractor electrode adapted for extracting the electron beam from the emitter tip electrode, a suppressor electrode, and at least one auxiliary emitter electrode arranged radially outside the suppressor electrode, and provided as a thermal electron emitter for thermally emitting electrons towards the optical axis.


Find Patent Forward Citations

Loading…