The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Sep. 08, 2006
Applicants:

Eric M. Lee, Austin, TX (US);

Junjun Liu, Austin, TX (US);

Dorel I. Toma, Dripping Springs, TX (US);

Inventors:

Eric M. Lee, Austin, TX (US);

Junjun Liu, Austin, TX (US);

Dorel I. Toma, Dripping Springs, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/00 (2006.01); B05B 5/00 (2006.01); H01L 21/67 (2006.01); H01L 21/3105 (2006.01); H01L 21/316 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67115 (2013.01); H01L 21/3105 (2013.01); H01L 21/31058 (2013.01); H01L 21/31612 (2013.01); H01L 21/31695 (2013.01);
Abstract

A thermal processing system and method for curing a dielectric film. The thermal processing system is configured to treat the dielectric film with ultraviolet (UV) radiation and infrared (IR) radiation in order to cure the dielectric film. The thermal processing system can include an array if IR and UV light-emitting devices (LEDs) configured to irradiate a substrate having a low dielectric constant (low-k) film. The method dries the dielectric film to remove contaminants from the film and exposes the dielectric film at a single stage to ultraviolet radiation and IR radiation.


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