The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2015
Filed:
Jul. 10, 2013
Cadence Design Systems, Inc., San Jose, CA (US);
Hongzhou Liu, Sewickley, PA (US);
Jushan Xie, Pleasanton, CA (US);
Michael Tian, San Jose, CA (US);
An-Chang Deng, Saratoga, CA (US);
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
A system, method, and computer program product for automatically approximating conventional Monte Carlo statistical device model evaluation for circuit simulation with drastic speed improvements, while preserving significant accuracy. Embodiments enable quick inspection of the effects of process mismatch variations on single devices and even large circuits compared to standard computationally prohibitive Monte Carlo analysis. Statistical device model variation is calculated as if all such variation is due to changes in threshold voltage, even though other physical phenomena are known to contribute. Threshold voltage variation is modeled as a function of statistical variation, device size, and working bias condition. Circuit simulation is faster when the full internal device model parameter set is not rebuilt for every Monte Carlo analysis iteration. Embodiments are compatible with both conventional SPICE and newer Fast SPICE simulations. Circuit designers may capture design sensitivity to manufacture process changes more easily with simplified statistical models.