The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Dec. 02, 2010
Applicants:

Pavan Y. Bashaboina, Hyderabad, IN;

Brent A. Goplen, Underhill, VT (US);

Howard S. Landis, Essex Junction, VT (US);

Inventors:

Pavan Y. Bashaboina, Hyderabad, IN;

Brent A. Goplen, Underhill, VT (US);

Howard S. Landis, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

Variation of a parameter of interest is reduced over a field of interest in, for example, an object design, such as a circuit design. The field of interest is divided into tiles. A parameter value is found for each tile and for a group of tiles around each tile. Using these values, variation of the parameter is determined. An adjusted value of the parameter for each tile is determined taking limits into account, iterating until variation is below a threshold value. Parameter uniformity is improved in some applications by over 30% with runtime reduced by an order of magnitude.


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