The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Jan. 19, 2011
Applicants:

Sanjeev Kaushal, San Jose, CA (US);

Sukesh Janubhai Patel, Cupertino, CA (US);

Kenji Sugishima, Tokyo, JP;

Inventors:

Sanjeev Kaushal, San Jose, CA (US);

Sukesh Janubhai Patel, Cupertino, CA (US);

Kenji Sugishima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01D 18/00 (2006.01); H01L 21/66 (2006.01); G05B 19/418 (2006.01); H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01L 22/20 (2013.01); G05B 19/41875 (2013.01); H01J 37/32926 (2013.01); H01L 22/12 (2013.01); H01L 22/26 (2013.01);
Abstract

System(s) and method(s) are provided for adjustment and analysis of performance of a tool through integration of tool operational data and spectroscopic data related to the tool. Such integration results in consolidated data that enable, in part, learning at least one relationship amongst selected portions of the consolidated data. Learning is performed autonomously without human intervention. Adjustment of performance of the tool relies at least in part on a learned relationship and includes generation of process recipe parameter(s) that can adjust a manufacturing process in order to produce a satisfactory tool performance in response to implementation of the manufacturing process. A process recipe parameter can be generated by solving an inverse problem based on the learned relationship. Analysis of performance of the tool can include assessment of synthetic performance scenarios, identification of spectroscopic condition(s) that affect performance, and extraction of endpoints based at least on time dependence spectroscopic data.


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