The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Feb. 08, 2012
Applicants:

Jayabrata Ghosh Dastidar, Campbell, CA (US);

Aman Aflaki Beni, San Jose, CA (US);

Zunhang Yu Kasnavi, Saratoga, CA (US);

Inventors:

Jayabrata Ghosh Dastidar, Campbell, CA (US);

Aman Aflaki Beni, San Jose, CA (US);

Zunhang Yu Kasnavi, Saratoga, CA (US);

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device tester is provided. The device tester includes a probe card and a substrate coupled to the probe card. The substrate has a plurality of layers for routing a signal. An integrated circuit is coupled to the substrate. The integrated circuit is operable to transmit an input signal received from a testing apparatus to a device under test through the substrate to a signal probe. The signal probe is further operable to receive a test signal from the device under test in response to the input signal, wherein the integrated circuit is operable to amplify the test signal, and transmit the amplified test signal to the testing apparatus.


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