The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2015
Filed:
Oct. 03, 2012
Applicants:
Kiyoto Nakamura, Tokyo, JP;
Takashi Fujisaki, Tokyo, JP;
Inventors:
Kiyoto Nakamura, Tokyo, JP;
Takashi Fujisaki, Tokyo, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/58 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
H01L 23/58 (2013.01); G01R 1/0466 (2013.01); H01L 2224/16225 (2013.01);
Abstract
A test carrier which can suppress the occurrence of contact defects while securing positional precision of the terminals is provided. A test carriercomprises: a base filmwhich has one main surface which has bumps which contact electrodesof the die; and a cover filmwhich is laid over the base film, the dieis held between the base filmand the cover film, the base filmhas: a first regionwhich has a first thickness t; and a second regionwhich has a second thickness twhich is thinner than the first thickness t, and the second regionfaces at least a part of the edgeof the die