The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8952339 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 10, 2015

Filed:

Feb. 20, 2013
Applicant:

Jeol Ltd., Tokyo, JP;

Inventor:

Fumio Hosokawa, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/02 (2006.01); H01J 37/153 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
H01J 37/02 (2013.01); H01J 37/153 (2013.01); H01J 37/26 (2013.01); H01J 2237/1534 (2013.01);
Abstract

A chromatic aberration corrector and method of controlling this chromatic aberration corrector is offered. The corrector has first and second multipole lenses for producing quadrupole fields and first and second transfer lenses each having a focal length of f. The first and second multipole lenses are arranged on opposite sides of the first and second transfer lenses. The distance between the first multipole lens and the first transfer lens is f. The distance between the first transfer lens and the second transfer lens is 2f. The distance between the second transfer lens and the second multipole lens is f−Δ. The corrector is so designed that the relationship, f>Δ>0, holds.


Find Patent Forward Citations

Hosokawa, Fumio. (2015). Chromatic aberration corrector and method of controlling same (U.S. Patent No. 8952339). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8952339

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