The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2015
Filed:
Dec. 27, 2011
Midori Sasaki, Hitachinaka, JP;
Terumi Tamura, Hitachinaka, JP;
Shinya Ito, Hitachinaka, JP;
Makoto Nogami, Tsuchiura, JP;
Midori Sasaki, Hitachinaka, JP;
Terumi Tamura, Hitachinaka, JP;
Shinya Ito, Hitachinaka, JP;
Makoto Nogami, Tsuchiura, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
The mass analyzing apparatus of the present invention can achieve the speed-up and simplification of the formation of a calibration curve for quantifying an analysis object in a mass analyzing apparatus. The mass analyzing apparatus is provided with: a sample storage-dilution unitfor storing samples of the analysis object including a quantitative calibrator in which, with respect to one analysis object to be quantified, two or more kinds of compounds selected from the analysis object, a plurality of stable isotope compounds of the analysis object and a plurality of analogue compounds of the analysis object are mixed at respectively different concentrations; an ionizing unitfor ionizing a sample; a mass analyzing unitfor analyzing the ionized sample; and a data processing unitin which, based on results of analysis of the quantitative calibrator carried out by the mass analyzing unittwo or more concentrations are measured, and the analysis object is quantified based on information of the measurement.